Silicon crystallization method using a ramp type laser beam

Application Number: 200510115452.5 Application date: 2005.11.03
name: Silicon crystallization method using a ramp type laser beam
Public (announcement) number: CN1783426 Public (announcement) day: 2006.06.07
Main classification number: H01L21/00 (2006.01)I The original application number of the division:
Classification number: H01L21/00(2006.01)I; H01L21/20(2006.01)I; H01L21/268(2006.01)I;
H01L21/324(2006.01)I; H01L21/336(2006.01)I; B23K26/00(2006.01)I;
C30B28/00(2006.01)I; G02F1/133(2006.01)I
Award day: priority: 2004.11.4 KR 10-2004-0089449
Application (patent) person: LG. Phillips LCD Co., Ltd.
address: Seoul, Korea
Invention (design) person: Yu Zaicheng International application:
International announcement: Enter country date:
Patent agency: Beijing Lvcheng Tongye Intellectual Property Agency Co., Ltd. agent: Xu Jinguo; Liang Hui
Summary
A crystallization method comprising: forming an amorphous silicon layer on a substrate; forming a front crystallization region by irradiating an amorphous silicon layer with a laser beam having a slope-shaped cross section lowered in a scanning direction; and moving a predetermined length in a scanning direction The second crystal is performed to partially overlap the front crystalline region formed by the front crystal.

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